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3. "Dynamic Hard Particels"
Another interesting finding
is that in nanoscale ductile mode cutting of brittle single crystals, dynamic
hard particles, i.e., atom groups with significantly shorter bond lengths
(Fig.3), would be formed, removed and reformed in the chip formation zone.
These hard particles, in turn, may cause the formation of micro/nano groove
wear at the tool flank. Experimental confirmation of the wear grooves at
the tool frank has been obtained in nanoscale ductile mode ductile cutting
of single crystalline silicon wafer with single crystalline diamond tools.
An example of such grooves is provided in Fig. 4.
Fig. 3. Presence of “dynamic hard
particles” in the chip formation zone in nanoscle ductile mode cutting.

Fig. 4. Micro/nano grooves on the diamond
tool flank face in cutting of single crystalline silicon.
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